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Single Vertical Focusing Device for HOPG, Cu or Ge Crystals
Single Horizontal Focusing Device for HOPG, Cu or Ge Crystals
Double Focusing Device for HOPG, Cu or Ge Crystals
Double H. Bending & V. focusing Device for Silicon Crystals
Double Face / Double Focusing Device for HOPG & Cu crystals
Double Face / Double H. Bending & V. focusing Device for Silicon Crystals
Single Vertical Focusing Device for Heusler Crystals
Single Horizontal Focusing Device for Heusler Crystals
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Tripe Axis Spectrometer
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For MR 400
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For G 206
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For G 350
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For DG 270-350
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For T, TT & DTT 100
For T, TT & DTT 170
For T, TT & DTT 250
For T, TT & DTT 350
For Rotation Modules
For MR 400
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Custom Design Instruments
MIRROTRON - KHI300-110
Horizontal Rotation for RSND Sample Stage
Instrument : Residual Stress Neutron Diffractometer
Organisation : MIRROTRON Ltd.
Technical Information :
Travel range : from -90° to +20° (110°)
Resolution : <0.01°
Absolute angle deviation : <0.01°
Angle reproducibility : <0.005°
Maximum speed : 5°/second
Dimensions : 1000 x 925 x 280mm
Inner radius : 300mm
Weight : around 220kg
Centered load capacity : 100kg
Equipment :
Geared stepper motor
Multi turn absolute encoder
Limit switches
POSITECHNICS
®
SAS - Artiparc - 9, rue Marcel Chabloz - F-38400 Saint Martin d'Hères - France
Phone : +33 (0) 476 620 039 - Cel. : +33 (0) 613 712 637 - Email : info@positechnics.com
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